International journal published by Institute of Information Theory and Automation

home contents of journal search by author by title by keyword by MSC instructions for authors editorial board distribution contact partners login create account forgotten password

Special issue: Statistical techniques in pattern recognition

The Bhattacharyya metric as an absolute similarity measure for frequency coded data

Cascading classifiers

Detecting a data set structure through the use of nonlinear projections search and optimization

Handwritten digit recognition by combined classifiers

A simple upper bound to the Bayes error probability for feature selection

Fuzzy clustering of spatial binary data

Featureless pattern classification

Combining adaptive vector quantization and prototype selection techniques to improve nearest neighbour classifiers

On selecting the best features in a noisy environment

Mixture of experts architectures for neural networks as a special case of conditional expectation formula

A scratch removal method

A comparative evaluation of medium- and large-scale feature selectors for pattern classifiers

Decomposition of high dimensional pattern spaces for hierarchical classification

Interpretation of pattern classification results, obtained from a test set

Transformation of structural patterns in discrete events? An application of structural methods in discrete event systems

Conceptual base of feature selection consulting system

Intrinsic dimensionality and small sample properties of classifiers

Construction of nonlinear discrimination function based on the MDL criterion

Probability distribution of transformed random variables with application to nonlinear features extraction

Piecewise linear classifiers preserving high local recognition rates

About the maximum information and maximum likelihood principles

Fuzzy Clustering Models and Applications